By Sachidanand Jha
•100 2nd CAD Exercises.
•50 3D CAD Exercises.
•Each workout will be designed on any CAD software program comparable to AutoCAD, SolidWorks, Catia, PTC Creo Parametric, Siemens NX, Autodesk Inventor and other.
•These workouts are designed that can assist you try out your easy CAD skills.
•Each workout could be assigned individually.
•No workout is a prerequisite for another.
Read Online or Download 150 CAD Exercises PDF
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Additional resources for 150 CAD Exercises
As many as 12 successive MCEs are observed at the maximum as in (A). (4) Likewise for CHB and CHBc, “high” nodes in p-well are subject to fail showing “leap-frog” cluster error bit pattern along a BL as triple leap-frog pattern in (B). 11 shows unnatural multiplicity observed in the test results. For all “0,” it is found that the number of double-bit error exceed those of single-bit error when the neutron energy becomes higher, while the trends for CHB seems rather normal. For CHB, there is a slight increase in quad-bit MCU, suggesting an increase in double leap-frog-type MCUs.
If the errors cannot be corrected even by power cycle, then those errors may be classified as hard error (HE). IDD current and device temperature are measured within a certain time interval independently. Error classification Phase I: Re-read Start Pc=No Set data pattern (Repeat) Re-read Log:Transient Error Write(W) all bits N Error? Y Read(R) Y Error? N N All bits? ,Temp. Measurement Log:Re-write Phase II: Re-write/Reset dd Re-write? N Y N All errors? Y Pc? N N Log: Static /MCBI* Y R/W OK? N Log:Pc=Yes; Log:SEFI Phase III: Power Cycle Log:Power Cycle Soft Error(PCSE) Y All pattern?
Furthermore, trends of power supply voltage decrease and current increase with trends of CMOS technology are introduced and the target of power integrity design is identified. Also, design methodology of power integrity such as time and frequency-domain analysis and design, printed circuit board design methodology, and example of real design References 5 results are introduced. In addition, principle and experiments on simultaneous switching noise are discussed. Chapter 5 describes fault-tolerant system technology as a system-level approach for mitigation measure of hardware failures, soft errors, and electro-magnetic disturbances.
150 CAD Exercises by Sachidanand Jha